Scanning Electron Microscope (SEM) Experiment Service

Instruction manual

First Edition (Revised on April, 2016)

Information

The characteristics for Scanning Electron Microscope (SEM) is simple sample preparation, wide adjustable range of magnification, image resolution, depth of field, and etc. In recent years,SEM has been widely used in biology, medicine, and other field. The electron beam of the SEM does not pass through the sample, only the surface of the sample is scanned to excite the secondary electrons. The image is a three-dimensional image, reflecting the surface structure of the specimen. So SEM specimens do not need to make thin slices.

The basic function of SEM is to observe the surface morphology of various solid samples. The depth of field is the features fo SEM, the observation can be the surface of sample, a cut surface, or a section.

Service Content

√Observe the biological samples, dynamic observation, and etc.

√Materials science, biology, medicine, semiconductor materials and devices

Service Procedure

1. Prepare test samples(Customer or our company provide).

2. Perform SEM according to customer requirements, provide to customer test image.

Imaging Instrument

SU 82220 SEM

Customer Providing

Experimental animals or test samples; specific requirements of experiment.